100V N Channel MOSFET HUASHUO HSBA15810C with Low RDS ON and High Frequency Switching Capability

Key Attributes
Model Number: HSBA15810C
Product Custom Attributes
Drain To Source Voltage:
100V
Current - Continuous Drain(Id):
100A
Operating Temperature -:
-55℃~+150℃
RDS(on):
4.5mΩ@10V,30A
Gate Threshold Voltage (Vgs(th)):
4V
Type:
N-Channel
Reverse Transfer Capacitance (Crss@Vds):
14pF
Number:
1 N-channel
Input Capacitance(Ciss):
4.725nF
Output Capacitance(Coss):
609pF
Pd - Power Dissipation:
208W
Gate Charge(Qg):
72nC@10V
Mfr. Part #:
HSBA15810C
Package:
PRPAK5x6-8L
Product Description

Product Overview

The HSBA15810C is a N-Channel 100V Fast Switching MOSFET designed for high-frequency switching applications. It features advanced high cell density Trench technology, offering super low RDS(ON) and 100% EAS Guaranteed. This MOSFET is ideal for applications such as motor drivers, Battery Management Systems (BMS), and high-frequency switching with synchronous rectification. A green device version is available.

Product Attributes

  • Brand: HS-Semi
  • Model: HSBA15810C
  • Channel Type: N-Channel
  • Technology: Trench
  • Availability: Green Device Available

Technical Specifications

Symbol Parameter Conditions Min. Typ. Max. Unit
Absolute Maximum Ratings
VDS Drain-Source Voltage 100 V
VGS Gate-Source Voltage 20 V
ID@TC=25 Continuous Drain Current, VGS @ 10V1,6 100 A
ID@TC=100 Continuous Drain Current, VGS @ 10V1,6 95 A
IDM Pulsed Drain Current2 480 A
EAS Single Pulse Avalanche Energy3 702 mJ
IAS Avalanche Current 53 A
PD@TC=25 Total Power Dissipation4 208 W
TSTG Storage Temperature Range -55 150
TJ Operating Junction Temperature Range -55 150
Thermal Data
RJA Thermal Resistance Junction-Ambient --- 62 /W
RJC Thermal Resistance Junction-Case1 --- 0.6 /W
Product Summary
VDS 100 V
RDS(ON),typ ID 100 A 3.7 m
ID 100 A
Electrical Characteristics (TJ=25 , unless otherwise noted)
BVDSS Drain-Source Breakdown Voltage VGS=0V , ID=250uA 100 --- --- V
RDS(ON) Static Drain-Source On-Resistance2 VGS=10V , ID=30A 3.7 4.5 m
VGS(th) Gate Threshold Voltage VGS=VDS , ID =250uA 2.0 3.0 4.0 V
IDSS Drain-Source Leakage Current VDS=100V , VGS=0V , TJ=25 --- 1 uA
IDSS Drain-Source Leakage Current VDS=100V , VGS=0V , TJ=125 --- 10 uA
IGSS Gate-Source Leakage Current VGS=20V , VDS=0V --- 100 nA
gfs Forward Transconductance VDS=5V , ID=30A 50 --- S
Rg Gate Resistance VDS=0V , VGS=0V , f=1MHz 1 ---
Qg Total Gate Charge (10V) VDS=50V , VGS=10V , ID=20A 72 --- nC
Qgs Gate-Source Charge 28 ---
Qgd Gate-Drain Charge 15 ---
Td(on) Turn-On Delay Time VDD=50V , VGS=10V , RG=3.0, ID=20A 35 --- ns
Tr Rise Time 18 --- ns
Td(off) Turn-Off Delay Time 45 --- ns
Tf Fall Time 55 --- ns
Ciss Input Capacitance VDS=50V , VGS=0V , f=1MHz 4725 --- pF
Coss Output Capacitance 609 --- pF
Crss Reverse Transfer Capacitance 14 --- pF
Diode Characteristics
IS Continuous Source Current1,5 VG=VD=0V , Force Current --- 100 A
VSD Diode Forward Voltage2 VGS=0V , IS=50A , TJ=25 --- 1.3 V
trr Reverse Recovery Time IF=30A , dI/dt=100A/s , TJ=25 --- 70 nS
Qrr Reverse Recovery Charge --- 170 nC

Notes:
1. The data tested by surface mounted on a 1 inch FR-4 board with 2OZ copper.
2. The data tested by pulsed, pulse width 300s, duty cycle 2%.
3. The EAS data shows Max. rating. The test condition is VDD=25V, VGS=10V, L=0.5mH, IAS=53A.
4. The power dissipation is limited by 150 junction temperature.
5. The data is theoretically the same as ID and IDM, in real applications, should be limited by total power dissipation.
6. Package limitation current.


2410121642_HUASHUO-HSBA15810C_C845605.pdf

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