Dual N Channel 60V Fast Switching MOSFET HUASHUO HSBB6214 with Low Gate Charge and RoHS Compliant Green Product

Key Attributes
Model Number: HSBB6214
Product Custom Attributes
Drain To Source Voltage:
60V
Current - Continuous Drain(Id):
16A
Operating Temperature -:
-55℃~+150℃
RDS(on):
42mΩ@10V,5A
Gate Threshold Voltage (Vgs(th)):
1.7V
Reverse Transfer Capacitance (Crss@Vds):
46pF@15V
Number:
2 N-Channel
Input Capacitance(Ciss):
1.027nF@15V
Pd - Power Dissipation:
21W
Gate Charge(Qg):
19nC@10V
Mfr. Part #:
HSBB6214
Package:
PRPAK3x3-8L
Product Description

Product Overview

The HSBB6214 is a dual N-channel 60V fast switching MOSFET designed with high cell density trench technology. It offers excellent RDS(ON) and gate charge, making it ideal for synchronous buck converter applications. This MOSFET meets RoHS and Green Product requirements and is 100% EAS guaranteed with full function reliability approval. Key advantages include super low gate charge and excellent Cdv/dt effect decline.

Product Attributes

  • Brand: HS-Semi
  • Product Type: Dual N-Channel Fast Switching MOSFET
  • Certifications: RoHS, Green Product
  • Reliability: 100% EAS Guaranteed

Technical Specifications

Symbol Parameter Conditions Min. Typ. Max. Unit
Absolute Maximum Ratings
VDS Drain-Source Voltage 60 V
VGS Gate-Source Voltage 20 V
ID@TC=25 Continuous Drain Current, VGS @ 10V1 16 A
ID@TC=70 Continuous Drain Current, VGS @ 10V1 10 A
ID@TA=25 Continuous Drain Current, VGS @ 10V1 4.5 A
ID@TA=70 Continuous Drain Current, VGS @ 10V1 3.6 A
IDM Pulsed Drain Current2 32 A
EAS Single Pulse Avalanche Energy3 22 mJ
IAS Avalanche Current 21 A
PD@TA=25 Total Power Dissipation4 1.7 W
PD@TC=25 Total Power Dissipation4 21 W
TSTG Storage Temperature Range -55 150
TJ Operating Junction Temperature Range -55 150
Thermal Data
RJA Thermal Resistance Junction-ambient 75 /W
RJC Thermal Resistance Junction-Case1 6 /W
Product Summary
Model HSBB6214
Type Dual N-Ch
Voltage 60V
Switching Fast Switching
Electrical Characteristics (TJ=25 , unless otherwise noted)
BVDSS Drain-Source Breakdown Voltage VGS=0V , ID=250uA 60 V
BVDSS/TJ BVDSS Temperature Coefficient Reference to 25 , ID=1mA 0.044 V/
RDS(ON),MAX Static Drain-Source On-Resistance2 VGS=10V , ID=5A 42 m
VGS=4.5V , ID=5A 52 m
VGS(th) Gate Threshold Voltage VGS=VDS , ID =250uA 1.0 1.7 2.5 V
VGS(th)/TJ VGS(th) Temperature Coefficient -4.8 mV/
IDSS Drain-Source Leakage Current VDS=48V , VGS=0V , TJ=25 1 uA
VDS=48V , VGS=0V , TJ=55 5 uA
IGSS Gate-Source Leakage Current VGS=20V , VDS=0V 100 nA
gfs Forward Transconductance VDS=5V , ID=5A 28 S
Rg Gate Resistance VDS=0V , VGS=0V , f=1MHz 2.5
Qg Total Gate Charge VDS=48V , VGS=10V , ID=4A 19 nC
Qgs Gate-Source Charge 2.6 nC
Qgd Gate-Drain Charge 4.1 nC
td(on) Turn-On Delay Time VDD=30V , VGS=10V , RG=3.3, ID=4A 3 ns
tr Rise Time 34 ns
td(off) Turn-Off Delay Time 23 ns
tf Fall Time 6 ns
Ciss Input Capacitance VDS=15V , VGS=0V , f=1MHz 1027 pF
Coss Output Capacitance 65 pF
Crss Reverse Transfer Capacitance 46 pF
Diode Characteristics
IS Continuous Source Current1,5 VG=VD=0V , Force Current 16 A
VSD Diode Forward Voltage2 VGS=0V , IS=1A , TJ=25 1.2 V
trr Reverse Recovery Time IF=4A , dI/dt=100A/s , TJ=25 12.1 nS
Qrr Reverse Recovery Charge 6.7 nC

Notes:

  • 1. Data tested by surface mounted on a 1 inch2 FR-4 board with 2OZ copper.
  • 2. Data tested by pulsed, pulse width 300s, duty cycle 2%.
  • 3. EAS data shows Max. rating. Test condition: VDD=25V, VGS=10V, L=0.1mH, IAS=21A.
  • 4. Power dissipation is limited by 150 junction temperature.
  • 5. Data is theoretically the same as ID and IDM; in real applications, should be limited by total power dissipation.

2507281508_HUASHUO-HSBB6214_C5341687.pdf
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