P Channel MOSFET HUASHUO HSU25P15 with 150V Drain Source Voltage and Superior CdV dt Effect Decline
Product Overview
The HSU25P15 is a P-Channel Fast Switching MOSFET featuring 150V drain-source voltage and advanced trench MOSFET technology. It offers excellent RDS(ON) and low gate charge, making it suitable for a wide variety of applications. This device meets RoHS and Green Product requirements, with 100% EAS guaranteed and full function reliability approved. Key advantages include a super low gate charge, excellent CdV/dt effect decline, and advanced high cell density trench technology.
Product Attributes
- Brand: HSU (implied by model number)
- Channel Type: P-Channel
- Technology: Advanced trench MOSFET
- Certifications: RoHS, Green Product
- Reliability: 100% EAS guaranteed, full function reliability approved
Technical Specifications
| Symbol | Parameter | Conditions | Min. | Typ. | Max. | Unit |
|---|---|---|---|---|---|---|
| Absolute Maximum Ratings | ||||||
| VDS | Drain-Source Voltage | -150 | V | |||
| VGS | Gate-Source Voltage | 20 | V | |||
| ID@TC=25 | Continuous Drain Current, VGS @ -10V | -23 | A | |||
| ID@TC=100 | Continuous Drain Current, VGS @ -10V | -15 | A | |||
| IDM | Pulsed Drain Current | (2) | -85 | A | ||
| EAS | Single Pulse Avalanche Energy | (3) | 220 | mJ | ||
| IAS | Avalanche Current | (3) | 24 | A | ||
| PD@TC=25 | Total Power Dissipation | (4) | 100 | W | ||
| TSTG | Storage Temperature Range | -55 | 150 | |||
| TJ | Operating Junction Temperature Range | -55 | 150 | |||
| Thermal Data | ||||||
| RJA | Thermal Resistance Junction-Ambient | --- | 62 | /W | ||
| RJC | Thermal Resistance Junction-Case | (1) | --- | 1.25 | /W | |
| Electrical Characteristics (TJ=25 , unless otherwise noted) | ||||||
| BVDSS | Drain-Source Breakdown Voltage | VGS=0V , ID=-250uA | -150 | --- | --- | V |
| RDS(ON),max | Static Drain-Source On-Resistance | (2) VGS=-10V , ID=-20A | 130 | 150 | m | |
| VGS(th) | Gate Threshold Voltage | VGS=VDS , ID =-250uA | -2.0 | -2.8 | -4.0 | V |
| IDSS | Drain-Source Leakage Current | VDS=-120V , VGS=0V , TJ=25 | --- | -1 | uA | |
| IGSS | Gate-Source Leakage Current | VGS=20V , VDS=0V | --- | 100 | nA | |
| gfs | Forward Transconductance | VDS=-10V , ID=-20A | 13 | --- | S | |
| Qg | Total Gate Charge | VDS=-75V , VGS=-10V , ID=-10A | 56 | --- | nC | |
| Qgs | Gate-Source Charge | 11 | --- | |||
| Qgd | Gate-Drain Charge | 8.5 | --- | |||
| Td(on) | Turn-On Delay Time | VDD=-75V , VGS=-10V , RG=6, ID=-10A | 33 | --- | ns | |
| Tr | Rise Time | 19 | --- | |||
| Td(off) | Turn-Off Delay Time | 149 | --- | |||
| Tf | Fall Time | 50 | --- | |||
| Ciss | Input Capacitance | VDS=-75V , VGS=0V , f=1MHz | 3600 | --- | pF | |
| Coss | Output Capacitance | 455 | --- | |||
| Crss | Reverse Transfer Capacitance | 186 | --- | |||
| Diode Characteristics | ||||||
| IS | Continuous Source Current | (1,5) VG=VD=0V , Force Current | --- | -23 | A | |
| VSD | Diode Forward Voltage | (2) VGS=0V , IS=-1A , TJ=25 | --- | -1.3 | V | |
Notes:
1. The data tested by surface mounted on a 1 inch FR-4 board with 2OZ copper.
2. The data tested by pulsed, pulse width 300s, duty cycle 2%.
3. The EAS data shows Max. rating. The test condition is VDD=-75V, VGS=-10V, L=0.5mH, IAS=-24A.
4. The power dissipation is limited by 150 junction temperature.
5. The data is theoretically the same as ID and IDM, in real applications, should be limited by total power dissipation.
2410122016_HUASHUO-HSU25P15_C22359257.pdf
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