Low on resistance N channel MOSFET HUAYI HY3306P ideal for battery powered and portable applications

Key Attributes
Model Number: HY3306P
Product Custom Attributes
Drain To Source Voltage:
60V
Current - Continuous Drain(Id):
130A
Operating Temperature -:
-55℃~+175℃
RDS(on):
6.8mΩ@10V
Gate Threshold Voltage (Vgs(th)):
4V@250uA
Type:
N-Channel
Reverse Transfer Capacitance (Crss@Vds):
149pF@25V
Number:
1 N-channel
Input Capacitance(Ciss):
3.142nF
Pd - Power Dissipation:
230W
Gate Charge(Qg):
68nC@10V
Mfr. Part #:
HY3306P
Package:
TO-220FB-3L
Product Description

Product Overview

The HY10N30 is a N-channel enhancement mode MOSFET featuring advanced trench technology for low on-resistance. It is avalanche tested, reliable, and rugged, with lead-free and RoHS compliant options available. This MOSFET is suitable for portable equipment and battery-powered systems, including synchronous rectification applications.

Product Attributes

  • Brand: HY
  • Origin: XI AN HUAYI MICROELECTRONICS CO., LTD.
  • Certifications: RoHS Compliant, Halogen Free

Technical Specifications

Symbol Parameter Test Conditions Unit Min Typ Max
Absolute Maximum Ratings
VDSS Drain-Source Voltage V 30
VGSS Gate-Source Voltage V ±20
TJ Max. Junction Temperature °C 150
TSTG Storage Temperature Range °C -55 150
ID Continuous Drain Current (TC=25°C, Unless Otherwise Noted) A 50
IDM Pulsed Drain Current (TC=25°C) A 200
PD Max. Power Dissipation (TC=25°C) W 250
RthJC Thermal Resistance, Junction to Case °C/W 0.5
RthJA Thermal Resistance, Junction to Ambient (Surface mounted on 1in. FR-4 board) °C/W 62.5
Electrical Characteristics (TC=25°C Unless Otherwise Noted)
BVDSS Drain Source Breakdown Voltage VGS=0V, ID=250µA V 30
IDSS Drain to Source Leakage Current VDS=30V, VGS=0V µA 1 10
VDS=30V, VGS=0V, TJ=125°C µA 10
VGS(th) Gate Threshold Voltage VDS=VGS, IDS=250µA V 1 1.3 1.6
IGSS Gate Source Leakage Current VGS=±20V, VDS=0V nA ±100
RDS(ON) Drain Source On State Resistance VGS=10V, IDS=25A 0.6 0.8
VSD Diode Forward Voltage ISD=25A, VGS=0V V 1 1.2
trr Reverse Recovery Time ISD=25A, dISD/dt=100A/µs ns 50
Qrr Reverse Recovery Charge ISD=25A, dISD/dt=100A/µs nC 100
Dynamic Characteristics
Rg Gate Resistance VGS=0V, VDS=0V, f=1MHz Ω 50
Ciss Input Capacitance VGS=0V, VDS=15V, f=1MHz pF 1500 2000
Coss Output Capacitance VGS=0V, VDS=15V, f=1MHz pF 300 400
Crss Reverse Transfer Capacitance VGS=0V, VDS=15V, f=1MHz pF 200 260
td(on) Turn on Delay Time VDD=15V, R L=0.6Ω, ID=25A, VGS=10V ns 10
tr Turn on Rise Time VDD=15V, R L=0.6Ω, ID=25A, VGS=10V ns 15
td(off) Turn off Delay Time VDD=15V, R L=0.6Ω, ID=25A, VGS=10V ns 20
tf Turn off Fall Time VDD=15V, R L=0.6Ω, ID=25A, VGS=10V ns 10
Qg Total Gate Charge VDS=15V, IDS=25A, VGS=10V nC 45 60
Qgs Gate Source Charge VDS=15V, IDS=25A, VGS=10V nC 8
Qgd Gate Drain Charge VDS=15V, IDS=25A, VGS=10V nC 15

2411220228_HUAYI-HY3306P_C357985.pdf

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