P channel 40V MOSFET HUASHUO HSU4119 featuring super low gate charge and excellent switching performance

Key Attributes
Model Number: HSU4119
Product Custom Attributes
Drain To Source Voltage:
40V
Current - Continuous Drain(Id):
120A
Operating Temperature -:
-55℃~+150℃
RDS(on):
3.5mΩ@10V;4.5mΩ@4.5V
Gate Threshold Voltage (Vgs(th)):
1V@250uA
Type:
P-Channel
Reverse Transfer Capacitance (Crss@Vds):
660pF
Number:
1 P-Channel
Output Capacitance(Coss):
780pF
Input Capacitance(Ciss):
10.7nF
Pd - Power Dissipation:
135W
Gate Charge(Qg):
190nC@10V
Mfr. Part #:
HSU4119
Package:
TO-252
Product Description

Product Overview

The HSU4119 is a P-channel 40V fast switching MOSFET featuring high cell density trench technology. It offers excellent RDS(ON) and low gate charge, making it ideal for synchronous buck converter applications. This device meets RoHS and Green Product requirements, with 100% EAS guaranteed and full function reliability approved. Key advantages include super low gate charge, excellent CdV/dt effect decline, and advanced high cell density trench technology.

Product Attributes

  • Brand: HS-Semi
  • Product Line: P-Ch 40V Fast Switching MOSFETs
  • Certifications: RoHS, Green Product
  • Reliability: 100% EAS Guaranteed, Full Function Reliability Approved

Technical Specifications

Absolute Maximum Ratings
Symbol Parameter Rating Units
VDS Drain-Source Voltage -40 V
VGS Gate-Source Voltage 20 V
ID@TC=25 Continuous Drain Current, VGS @ -10V1,6 -120 A
ID@TC=100 Continuous Drain Current, VGS @ -10V1,6 -90 A
IDM Pulsed Drain Current2 -480 A
EAS Single Pulse Avalanche Energy3 1250 mJ
IAS Avalanche Current -70 A
PD@TC=25 Total Power Dissipation4 135 W
TSTG Storage Temperature Range -55 to 150
TJ Operating Junction Temperature Range -55 to 150
Thermal Data
Symbol Parameter Typ. Max. Unit
RJA Thermal Resistance Junction-ambient 1(t10S) --- 20 /W
RJA Thermal Resistance Junction-ambient 1(Steady State) --- 62 /W
RJC Thermal Resistance Junction-case 1 --- 1.8 /W
Electrical Characteristics (TJ=25 , unless otherwise noted)
Symbol Parameter Conditions Typ. Max. Unit
BVDSS Drain-Source Breakdown Voltage VGS=0V , ID=-250uA -40 --- V
RDS(ON) Static Drain-Source On-Resistance2 VGS=-10V , ID=-30A 3.5 4.0 m
RDS(ON) Static Drain-Source On-Resistance2 VGS=-4.5V , ID=-20A 4.5 5.3 m
VGS(th) Gate Threshold Voltage VGS=VDS , ID =-250uA -1.0 -2.5 V
IDSS Drain-Source Leakage Current VDS=-40V , VGS=0V , TJ=25 --- -1 uA
IDSS Drain-Source Leakage Current VDS=-40V , VGS=0V , TJ=125 --- -100 uA
IGSS Gate-Source Leakage Current VGS=20V , VDS=0V --- 100 nA
Rg Gate resistance VDS=0V , VGS=0V , f=1MHz 1.7 ---
Qg Total Gate Charge (-10V) VDS=-20V , VGS=-10V , ID=-20A --- 190 nC
Qgs Gate-Source Charge --- 24 nC
Qgd Gate-Drain Charge --- 38 nC
td(on) Turn-On Delay Time VDD=-20V , VGS=-10V , RG=3, ID=-10A --- 18 ns
tr Rise Time --- 3.6 ns
td(off) Turn-Off Delay Time --- 21 ns
tf Fall Time --- 39 ns
Ciss Input Capacitance VDS=-20V , VGS=0V , f=1MHz --- 10700 pF
Coss Output Capacitance --- 780 pF
Crss Reverse Transfer Capacitance --- 660 pF
Diode Characteristics
Symbol Parameter Conditions Typ. Max. Unit
IS Continuous Source Current1,5 VG=VD=0V , Force Current --- -120 A
VSD Diode Forward Voltage2 VGS=0V , IS=-20A , TJ=25 --- -1.2 V
trr Reverse Recovery Time IF=-20A , di/dt=100A/s , TJ=25 --- 52 nS
Qrr Reverse Recovery Charge --- 128 nC

Notes:

  • 1. Data tested by surface mounted on a 1 inch2 FR-4 board with 2OZ copper.
  • 2. Data tested by pulsed, pulse width 300s, duty cycle 2%.
  • 3. EAS data shows Max. rating. Test condition is VDD=-40V, VGS=-10V, L=0.5mH, IAS=-70A.
  • 4. Power dissipation is limited by 150 junction temperature.
  • 5. Data is theoretically the same as ID and IDM; in real applications, should be limited by total power dissipation.
  • 6. Maximum current rating is package limited.

2411251450_HUASHUO-HSU4119_C28314523.pdf
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