P channel 40V MOSFET HUASHUO HSU4119 featuring super low gate charge and excellent switching performance
Product Overview
The HSU4119 is a P-channel 40V fast switching MOSFET featuring high cell density trench technology. It offers excellent RDS(ON) and low gate charge, making it ideal for synchronous buck converter applications. This device meets RoHS and Green Product requirements, with 100% EAS guaranteed and full function reliability approved. Key advantages include super low gate charge, excellent CdV/dt effect decline, and advanced high cell density trench technology.
Product Attributes
- Brand: HS-Semi
- Product Line: P-Ch 40V Fast Switching MOSFETs
- Certifications: RoHS, Green Product
- Reliability: 100% EAS Guaranteed, Full Function Reliability Approved
Technical Specifications
| Absolute Maximum Ratings | |||
|---|---|---|---|
| Symbol | Parameter | Rating | Units |
| VDS | Drain-Source Voltage | -40 | V |
| VGS | Gate-Source Voltage | 20 | V |
| ID@TC=25 | Continuous Drain Current, VGS @ -10V1,6 | -120 | A |
| ID@TC=100 | Continuous Drain Current, VGS @ -10V1,6 | -90 | A |
| IDM | Pulsed Drain Current2 | -480 | A |
| EAS | Single Pulse Avalanche Energy3 | 1250 | mJ |
| IAS | Avalanche Current | -70 | A |
| PD@TC=25 | Total Power Dissipation4 | 135 | W |
| TSTG | Storage Temperature Range | -55 to 150 | |
| TJ | Operating Junction Temperature Range | -55 to 150 | |
| Thermal Data | ||||
|---|---|---|---|---|
| Symbol | Parameter | Typ. | Max. | Unit |
| RJA | Thermal Resistance Junction-ambient 1(t10S) | --- | 20 | /W |
| RJA | Thermal Resistance Junction-ambient 1(Steady State) | --- | 62 | /W |
| RJC | Thermal Resistance Junction-case 1 | --- | 1.8 | /W |
| Electrical Characteristics (TJ=25 , unless otherwise noted) | |||||
|---|---|---|---|---|---|
| Symbol | Parameter | Conditions | Typ. | Max. | Unit |
| BVDSS | Drain-Source Breakdown Voltage | VGS=0V , ID=-250uA | -40 | --- | V |
| RDS(ON) | Static Drain-Source On-Resistance2 | VGS=-10V , ID=-30A | 3.5 | 4.0 | m |
| RDS(ON) | Static Drain-Source On-Resistance2 | VGS=-4.5V , ID=-20A | 4.5 | 5.3 | m |
| VGS(th) | Gate Threshold Voltage | VGS=VDS , ID =-250uA | -1.0 | -2.5 | V |
| IDSS | Drain-Source Leakage Current | VDS=-40V , VGS=0V , TJ=25 | --- | -1 | uA |
| IDSS | Drain-Source Leakage Current | VDS=-40V , VGS=0V , TJ=125 | --- | -100 | uA |
| IGSS | Gate-Source Leakage Current | VGS=20V , VDS=0V | --- | 100 | nA |
| Rg | Gate resistance | VDS=0V , VGS=0V , f=1MHz | 1.7 | --- | |
| Qg | Total Gate Charge (-10V) | VDS=-20V , VGS=-10V , ID=-20A | --- | 190 | nC |
| Qgs | Gate-Source Charge | --- | 24 | nC | |
| Qgd | Gate-Drain Charge | --- | 38 | nC | |
| td(on) | Turn-On Delay Time | VDD=-20V , VGS=-10V , RG=3, ID=-10A | --- | 18 | ns |
| tr | Rise Time | --- | 3.6 | ns | |
| td(off) | Turn-Off Delay Time | --- | 21 | ns | |
| tf | Fall Time | --- | 39 | ns | |
| Ciss | Input Capacitance | VDS=-20V , VGS=0V , f=1MHz | --- | 10700 | pF |
| Coss | Output Capacitance | --- | 780 | pF | |
| Crss | Reverse Transfer Capacitance | --- | 660 | pF | |
| Diode Characteristics | |||||
|---|---|---|---|---|---|
| Symbol | Parameter | Conditions | Typ. | Max. | Unit |
| IS | Continuous Source Current1,5 | VG=VD=0V , Force Current | --- | -120 | A |
| VSD | Diode Forward Voltage2 | VGS=0V , IS=-20A , TJ=25 | --- | -1.2 | V |
| trr | Reverse Recovery Time | IF=-20A , di/dt=100A/s , TJ=25 | --- | 52 | nS |
| Qrr | Reverse Recovery Charge | --- | 128 | nC | |
Notes:
- 1. Data tested by surface mounted on a 1 inch2 FR-4 board with 2OZ copper.
- 2. Data tested by pulsed, pulse width 300s, duty cycle 2%.
- 3. EAS data shows Max. rating. Test condition is VDD=-40V, VGS=-10V, L=0.5mH, IAS=-70A.
- 4. Power dissipation is limited by 150 junction temperature.
- 5. Data is theoretically the same as ID and IDM; in real applications, should be limited by total power dissipation.
- 6. Maximum current rating is package limited.
2411251450_HUASHUO-HSU4119_C28314523.pdf
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