Fast switching MOSFET HUASHUO HSP0026 featuring high cell density trench technology and low conduction losses

Key Attributes
Model Number: HSP0026
Product Custom Attributes
Drain To Source Voltage:
100V
Current - Continuous Drain(Id):
50A
Operating Temperature -:
-55℃~+150℃@(Tj)
RDS(on):
16mΩ@10V,9A
Gate Threshold Voltage (Vgs(th)):
2.5V
Reverse Transfer Capacitance (Crss@Vds):
125pF@15V
Number:
1 N-channel
Pd - Power Dissipation:
62.5W
Input Capacitance(Ciss):
1.93nF@15V
Gate Charge(Qg):
36nC@10V
Mfr. Part #:
HSP0026
Package:
TO-220
Product Description

Product Overview

The HSP0026 is a high cell density trenched N-channel MOSFET designed for fast switching applications. It offers excellent RDS(ON) and gate charge, making it suitable for most synchronous buck converter applications. This MOSFET meets RoHS and Green Product requirements and is 100% EAS guaranteed with full function reliability approval. Key features include super low gate charge, excellent Cdv/dt effect decline, and advanced high cell density trench technology.

Product Attributes

  • Brand: HS-Semi
  • Product Type: N-Channel Fast Switching MOSFET
  • Certifications: RoHS, Green Product
  • Reliability: 100% EAS guaranteed, full function reliability approved
  • Availability: Green Device Available

Technical Specifications

Symbol Parameter Conditions Min. Typ. Max. Unit
Absolute Maximum Ratings
VDS Drain-Source Voltage 100 V
VGS Gate-Source Voltage ±20 V
ID@TC=25 Continuous Drain Current, VGS @ 10V1 50 A
ID@TC=70 Continuous Drain Current, VGS @ 10V1 22 A
IDM Pulsed Drain Current2 75 A
EAS Single Pulse Avalanche Energy3 780 mJ
IAS Avalanche Current 18 A
PD@TC=25 Total Power Dissipation4 62.5 W
TSTG Storage Temperature Range -55 150
TJ Operating Junction Temperature Range -55 150
Thermal Data
RJA Thermal Resistance Junction-ambient 1(t≤10S) --- 50 /W
RJA Thermal Resistance Junction-ambient 1(Steady State) --- 2 /W
Electrical Characteristics (TJ=25 °C, unless otherwise noted)
BVDSS Drain-Source Breakdown Voltage VGS=0V , ID=250uA 100 --- --- V
ΔBVDSS/ΔTJ BVDSS Temperature Coefficient Reference to 25°C , ID=1mA 0.08 --- V/°C
RDS(ON) Static Drain-Source On-Resistance2 VGS=10V , ID=9A 16 22
RDS(ON) Static Drain-Source On-Resistance2 VGS=4.5V , ID=7A 20 28
VGS(th) Gate Threshold Voltage VGS=VDS , ID =250uA 1.2 --- 2.5 V
ΔVGS(th) VGS(th) Temperature Coefficient -5.5 --- mV/°C
IDSS Drain-Source Leakage Current VDS=80V , VGS=0V , TJ=25°C --- 10 µA
IDSS Drain-Source Leakage Current VDS=80V , VGS=0V , TJ=55°C --- 100 µA
IGSS Gate-Source Leakage Current VGS=±20V , VDS=0V --- ±100 nA
gfs Forward Transconductance VDS=5V , ID=9A 28 --- S
Rg Gate Resistance VDS=0V , VGS=0V , f=1MHz 1.6 --- Ω
Qg Total Gate Charge (10V) VDS=80V , VGS=10V , ID=7A 36 --- nC
Qgs Gate-Source Charge 5 --- nC
Qgd Gate-Drain Charge 10 --- nC
td(on) Turn-On Delay Time VDD=50V , VGS=10V , RG=3.3Ω ID=7A 11.5 --- ns
tr Rise Time 29 --- ns
td(off) Turn-Off Delay Time 42 --- ns
tf Fall Time 18 --- ns
Ciss Input Capacitance VDS=15V , VGS=0V , f=1MHz 1930 --- pF
Coss Output Capacitance 245 --- pF
Crss Reverse Transfer Capacitance 125 --- pF
Diode Characteristics
IS Continuous Source Current1,6 VG=VD=0V , Force Current --- 50 A
VSD Diode Forward Voltage2 VGS=0V , IS=1A , TJ=25°C --- 1.2 V
trr Reverse Recovery Time IF=7A , dI/dt=100A/µs , TJ=25°C 48 --- nS
Qrr Reverse Recovery Charge 29 --- nC

2410121642_HUASHUO-HSP0026_C7543710.pdf
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