High frequency switching MOSFET HUAKE SMF11N50 with low gate charge and avalanche tested reliability

Key Attributes
Model Number: SMF11N50
Product Custom Attributes
Drain To Source Voltage:
500V
Current - Continuous Drain(Id):
11A
RDS(on):
600mΩ@10V
Gate Threshold Voltage (Vgs(th)):
4V@250uA
Type:
N-Channel
Reverse Transfer Capacitance (Crss@Vds):
8.1pF@25V
Number:
1 N-channel
Input Capacitance(Ciss):
1.514nF@25V
Pd - Power Dissipation:
48W
Gate Charge(Qg):
33nC
Mfr. Part #:
SMF11N50
Package:
TO-220F
Product Description

Product Overview

The SMF11N50 is a 500V N-Channel MOSFET from HUAKE semiconductors, designed for high-frequency switching applications. It features low gate charge, low Crss, 100% avalanche tested, fast switching, and improved dv/dt capability. This MOSFET is ideal for High Frequency Switching Mode Power Supplies and Active Power Factor Correction.

Product Attributes

  • Brand: HUAKE semiconductors
  • Product Series: SMF11N50
  • Chip Version: U
  • Document Version: 1.0

Technical Specifications

SymbolParameterTest ConditionsMinTypMaxUnit
Absolute Maximum Ratings
VDSSDrain-Source Voltage500V
IDDrain Current - Continuous (Tc=25C)11.0*A
IDDrain Current - Continuous (Tc=100C)6.96*A
IDMDrain Current - Pulsed (Note1)44*A
VGSSGate-Source Voltage30V
EASSingle Pulsed Avalanche Energy (Limit Reference Value) (Note2)619mJ
IARAvalanche Current (Note1)10.0A
EARRepetitive Avalanche Energy (Note1)16.0mJ
dv/dtPeak Diode Recovery dv/dt (Note3)4.5V/ns
PDPower Dissipation(TC =25C)48W
-Derate above 25C0.38W/C
TjOperating Junction Temperature150C
TstgStorage Temperature Range-55+150C
RJCThermal Resistance, Junction to Case2.6C /W
RJAThermal Resistance, Junction to Ambient62.5C /W
Electrical Characteristics
BVDSSDrain-source Breakdown VoltageVGS=0V ,ID=250A500V
BVDSS/TJBreakdown Voltage Temperature CoefficientID=250A (Referenced to 25C)0.55V/C
IDSSZero Gate Voltage Drain CurrentVDS=500V,VGS=0V1A
IDSSZero Gate Voltage Drain CurrentVDS=400V,Tc=125C10A
IGSSFGate-Body Leakage Current, ForwardVGS=+30V, VDS=0V100nA
IGSSRGate-Body Leakage Current, ReverseVGS=-30V, VDS=0V-100nA
VGS(th)Gate Threshold VoltageVDS= VGS, ID=250A2.04.0V
RDS(on)Static Drain-Source On-ResistanceVGS=10 V, ID=5.5A0.460.60
gFSForward TransconductanceVDS=20 V, ID=5.5A (Note4)9.5S
Dynamic Characteristics
CissInput CapacitanceVDS=25V,VGS=0V, f=1.0MHz1514pF
CossOutput Capacitance144pF
CrssReverse Transfer Capacitance8.1pF
Switching Characteristics
td(on)Turn-On Delay TimeVDD = 250 V, ID = 11 A, RG = 25 (Note4,5)30ns
trTurn-On Rise Time25ns
td(off)Turn-Off Delay Time54ns
tfTurn-Off Fall Time27ns
QgTotal Gate ChargeVDS = 400 V, ID =11 A, VGS = 10 V (Note4,5)33nC
QgsGate-Source Charge7.8nC
QgdGate-Drain Charge14nC
Drain-Source Diode Characteristics
ISMaximum Continuous Drain-Source Diode Forward Current11A
ISMMaximum Pulsed Drain-Source Diode Forward Current44A
VSDDrain-Source Diode Forward VoltageVGS =0V,IS=11.0 A1.4V
trrReverse Recovery TimeVGS =0V, IS=11.0 A, d IF /dt=100A/s (Note4)388ns
QrrReverse Recovery Charge3.51C

2410121937_HUAKE-SMF11N50_C19725787.pdf

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