P channel 30V fast switching MOSFET HUASHUO HSBA3115 with super low gate charge and trench technology

Key Attributes
Model Number: HSBA3115
Product Custom Attributes
Drain To Source Voltage:
30V
Current - Continuous Drain(Id):
59A
Operating Temperature -:
-55℃~+150℃
RDS(on):
9.8mΩ@10V,10A
Gate Threshold Voltage (Vgs(th)):
1V
Reverse Transfer Capacitance (Crss@Vds):
421pF@15V
Number:
1 P-Channel
Input Capacitance(Ciss):
3.448nF@15V
Pd - Power Dissipation:
52.1W
Gate Charge(Qg):
33nC@4.5V
Mfr. Part #:
HSBA3115
Package:
PRPAK5x6-8L
Product Description

Product Overview

The HSBA3115 is a P-channel, 30V fast-switching MOSFET featuring high cell density trench technology. It offers excellent RDS(ON) and gate charge, making it ideal for synchronous buck converter applications. This product meets RoHS and Green Product requirements and is 100% EAS guaranteed with full function reliability approval. Key benefits include super low gate charge and excellent CdV/dt effect decline.

Product Attributes

  • Brand: HS-Semi
  • Product Series: HSBA3115
  • Technology: Trench MOSFET
  • Channel Type: P-Channel
  • Certifications: RoHS, Green Product
  • Guarantees: 100% EAS Guaranteed

Technical Specifications

Symbol Parameter Conditions Min. Typ. Max. Units
VDS Drain-Source Voltage -30 V
VGS Gate-Source Voltage ±25 V
ID@TC=25 Continuous Drain Current, VGS @ -10V1 -59 A
ID@TC=100 Continuous Drain Current, VGS @ -10V1 -37 A
ID@TA=25 Continuous Drain Current, VGS @ -10V1 -18 -11.6 A
ID@TA=70 Continuous Drain Current, VGS @ -10V1 -14.6 -9.3 A
IDM Pulsed Drain Current2 -180 A
EAS Single Pulse Avalanche Energy3 153 mJ
IAS Avalanche Current -55.4 A
PD@TC=25 Total Power Dissipation4 52.1 W
PD@TA=25 Total Power Dissipation4 5 2 W
TSTG Storage Temperature Range -55 150
TJ Operating Junction Temperature Range -55 150
RJA Thermal Resistance Junction-Ambient1 10s Steady State 62 /W
RJA Thermal Resistance Junction-Ambient1 (t ≤10s) 25 /W
RJC Thermal Resistance Junction-Case1 2.4 /W
BVDSS Drain-Source Breakdown Voltage VGS=0V , ID=-250uA -30 V
ΔBVDSS/ΔTJ BVDSS Temperature Coefficient Reference to 25 , ID=-1mA -0.018 V/
RDS(ON) Static Drain-Source On-Resistance2 VGS=-10V , ID=-20A 7.8 9.8
RDS(ON) Static Drain-Source On-Resistance2 VGS=-4.5V , ID=-15A 11 15 V
VGS(th) Gate Threshold Voltage VGS=VDS , ID =-250uA -1.0 -2.5 V
ΔVGS(th)/ΔTJ VGS(th) Temperature Coefficient 5.04 mV/
IDSS Drain-Source Leakage Current VDS=-24V , VGS=0V , TJ=25 1 µA
IDSS Drain-Source Leakage Current VDS=-24V , VGS=0V , TJ=55 5 µA
IGSS Gate-Source Leakage Current VGS=±25V , VDS=0V ±100 nA
gfs Forward Transconductance VDS=-5V , ID=-30A 26.4 S
Qg Total Gate Charge (-4.5V) VDS=-15V , VGS=-4.5V , ID=-15A 33 nC
Qgs Gate-Source Charge 10.7
Qgd Gate-Drain Charge 12.8
td(on) Turn-On Delay Time VDD=-15V , VGS=-10V , RG=3.3Ω, ID=-15A 8 ns
tr Rise Time 17.8
td(off) Turn-Off Delay Time 78.4
tf Fall Time 43.6
Ciss Input Capacitance VDS=-15V , VGS=0V , f=1MHz 3448 pF
Coss Output Capacitance 508
Crss Reverse Transfer Capacitance 421
IS Continuous Source Current1,5 VG=VD=0V , Force Current -59 A
VSD Diode Forward Voltage2 VGS=0V , IS=-1A , TJ=25 -1.2 V
trr Reverse Recovery Time IF=-15A , dI/dt=100A/µs , TJ=25 29 nS
Qrr Reverse Recovery Charge 15 nC

Notes:
1. The data tested by surface mounted on a 1 inch2 FR-4 board with 2OZ copper.
2. The data tested by pulsed, pulse width ≤ 300µs, duty cycle ≤ 2%.
3. The EAS data shows Max. rating. The test condition is VDD=-25V, VGS=-10V, L=0.1mH, IAS=-55.4A.
4. The power dissipation is limited by 150 junction temperature.
5. The data is theoretically the same as ID and IDM, in real applications, should be limited by total power dissipation.
Ordering Information:
Part Number Package Code Packaging
HSBA3115 PRPAK5*6 3000/Tape&Reel

2410121456_HUASHUO-HSBA3115_C701055.pdf
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