30V N channel MOSFET HUASHUO HSBA3004 with high cell density trench design and super low gate charge

Key Attributes
Model Number: HSBA3004
Product Custom Attributes
Drain To Source Voltage:
30V
Current - Continuous Drain(Id):
58A
Operating Temperature -:
-55℃~+150℃
RDS(on):
8.5mΩ@10V
Gate Threshold Voltage (Vgs(th)):
2.5V@250uA
Type:
N-Channel
Reverse Transfer Capacitance (Crss@Vds):
183pF
Number:
1 N-channel
Output Capacitance(Coss):
228pF
Input Capacitance(Ciss):
1.844nF@15V
Pd - Power Dissipation:
46W
Gate Charge(Qg):
17.6nC@4.5V
Mfr. Part #:
HSBA3004
Package:
PRPAK5x6-8L
Product Description

Product Overview

The HSBA3004 is a high cell density trenched N-channel 30V Fast Switching MOSFET designed for applications requiring excellent RDS(ON) and low gate charge. This device meets RoHS and Green Product requirements, with 100% EAS guaranteed and full function reliability approved. It offers super low gate charge and excellent CdV/dt effect decline, utilizing advanced high cell density Trench technology.

Product Attributes

  • Brand: HS-Semi
  • Product Type: N-Channel MOSFET
  • Technology: Trench
  • Certifications: RoHS, Green Device Available
  • EAS Guaranteed: 100%

Technical Specifications

Parameter Conditions Min. Typ. Max. Units
Drain-Source Voltage (VDS) 30 V
Gate-Source Voltage (VGS) 20 V
Continuous Drain Current (ID@TC=25) VGS @ 10V 58 A
Continuous Drain Current (ID@TC=100) VGS @ 10V 38 A
Continuous Drain Current (ID@TA=25) VGS @ 10V 12 A
Continuous Drain Current (ID@TA=70) VGS @ 10V 9.6 A
Pulsed Drain Current (IDM) 115 A
Single Pulse Avalanche Energy (EAS) 57.8 mJ
Avalanche Current (IAS) 34 A
Total Power Dissipation (PD@TC=25) 46 W
Total Power Dissipation (PD@TA=25) 2 W
Storage Temperature Range (TSTG) -55 150
Operating Junction Temperature Range (TJ) -55 150
Thermal Resistance Junction-Ambient (RJA) --- 62 /W
Thermal Resistance Junction-Case (RJC) --- 2.7 /W
Drain-Source Breakdown Voltage (BVDSS) VGS=0V , ID=250uA 30 --- --- V
BVDSS Temperature Coefficient Reference to 25 , ID=1mA 0.027 --- V/
Static Drain-Source On-Resistance (RDS(ON),max) VGS=10V , ID=30A 6.5 8.5 m
Static Drain-Source On-Resistance (RDS(ON),max) VGS=4.5V , ID=15A 11 14 m
Gate Threshold Voltage (VGS(th)) VGS=VDS , ID =250uA 1.2 1.5 2.5 V
VGS(th) Temperature Coefficient (VGS(th)) -5.8 --- mV/
Drain-Source Leakage Current (IDSS) VDS=24V , VGS=0V , TJ=25 --- 1 uA
Drain-Source Leakage Current (IDSS) VDS=24V , VGS=0V , TJ=55 --- 5 uA
Gate-Source Leakage Current (IGSS) VGS=20V , VDS=0V --- 100 nA
Forward Transconductance (gfs) VDS=5V , ID=30A 38 --- S
Gate Resistance (Rg) VDS=0V , VGS=0V , f=1MHz 1.7 2.9
Total Gate Charge (Qg) (4.5V) VDS=15V , VGS=4.5V , ID=15A 12.6 17.6 nC
Gate-Source Charge (Qgs) 4.2 5.9 nC
Gate-Drain Charge (Qgd) 5.1 7.1 nC
Turn-On Delay Time (td(on)) VDD=15V , VGS=10V , RG=3.3 , ID=15A 4.6 9.2 ns
Rise Time (tr) 12.2 22 ns
Turn-Off Delay Time (td(off)) 26.6 53 ns
Fall Time (tf) 8 16 ns
Input Capacitance (Ciss) VDS=15V , VGS=0V , f=1MHz 1317 1844 pF
Output Capacitance (Coss) 163 228 pF
Reverse Transfer Capacitance (Crss) 131 183 pF
Continuous Source Current (IS) VG=VD=0V , Force Current --- 58 A
Pulsed Source Current (ISM) --- 115 A
Diode Forward Voltage (VSD) VGS=0V , IS=1A , TJ=25 --- 1 V
Reverse Recovery Time (trr) IF=30A , dI/dt=100A/s , TJ=25 9.2 --- nS
Reverse Recovery Charge (Qrr) 2 --- nC

Note: Data tested by surface mounted on a 1 inch2 FR-4 board with 2OZ copper unless otherwise specified. Pulsed data has pulse width 300s, duty cycle 2%. EAS data shows Max. rating. Power dissipation is limited by 150 junction temperature.

Ordering Information:

Part Number Package Code Packaging
HSBA3004 PRPAK5*6 3000/Tape&Reel

2410121447_HUASHUO-HSBA3004_C2828500.pdf
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