High Voltage Power MOSFET KIA Semicon Tech KIA12N65H 650V 12A N Channel for Power Factor Correction

Key Attributes
Model Number: KIA12N65H
Product Custom Attributes
Drain To Source Voltage:
650V
Current - Continuous Drain(Id):
12A
Operating Temperature -:
-
RDS(on):
-
Gate Threshold Voltage (Vgs(th)):
4V@250uA
Type:
N-Channel
Reverse Transfer Capacitance (Crss@Vds):
-
Number:
1 N-channel
Input Capacitance(Ciss):
-
Output Capacitance(Coss):
-
Pd - Power Dissipation:
54W
Gate Charge(Qg):
90nC@10V
Mfr. Part #:
KIA12N65H
Package:
TO-220F-3
Product Description

Product Overview

The KIA12N65H is an N-Channel enhancement mode silicon gate power MOSFET designed for high voltage, high speed power switching applications. It is suitable for use in high efficiency switched mode power supplies, active power factor correction, and electronic lamp ballasts based on half bridge topology. Key advantages include low gate charge, fast switching capability, specified avalanche energy, and improved dv/dt capability.

Product Attributes

  • Brand: KIA SEMICONDUCTORS
  • Model: 12N65H
  • Type: N-CHANNEL MOSFET
  • Voltage Rating: 650V
  • Current Rating: 12A
  • Origin: Not Specified
  • Material: Silicon Gate
  • Color: Not Specified
  • Certifications: Not Specified

Technical Specifications

ParameterSymbolConditionsMinTypMaxUnit
Drain-source voltageVDSS650V
Drain-source voltageVGSS±30V
Drain current continuousIDTC=25 C12.0*A
Drain current continuousIDTC=100 C7.4*A
Drain current pulsedIDP(note 1)48.0*A
Avalanche energy RepetitiveEAR(note 1)23.1mJ
Avalanche energy Single pulseEAS(note 2)865mJ
Peak diode recovery dv/dtdv/dt(note 3)4.5V/ns
Total power dissipationPDTC=25 C54W
Total power dissipation derateabove 25 C0.43W/C
Junction temperatureTJ+150C
Storage temperatureTSTG-55+150C
Thermal resistance,Junction--ambientRthJA62.5C/W
Thermal resistance,Junction-caseRthJC2.33C/W
Drain-source breakdown voltageBVDSSVGS=0V,ID=250A650V
Zero gate voltage drain currentIDSSVDS=650V ,VGS=0V1µA
Zero gate voltage drain currentIDSSVDS=520V ,TC=125ºC10µA
Gate-body leakage current ForwardIGSSVGS=30V,VDS=0V100nA
Gate-body leakage current ReverseIGSSVGS=-30V,VDS=0V-100nA
Breakdown voltage temperature coefficientΔBVDSS/ΔTJID=250µA-0.7V/ºC
Gate threshold voltageVGS(th)VDS=VGS, ID=250µA2.04.0V
Static drain-source on-resistanceRDS(on)VGS=10V,ID=6.0A0.630.75Ω
Input capacitanceCissVDS=25V,VGS=0V, f=1MHz1850pF
Output capacitanceCoss180pF
Reverse transfer capacitanceCrss20pF
Turn-on delay timetd(on)VDD=325V,ID=12.0A, RG=25Ω(note4,5)30ns
Rise timetr90ns
Turn-off delay timetd(off)140ns
Fall timetf90ns
Total gate chargeQgVDS=520V,ID=12.0A VGS=10V,(note4,5)52nC
Gate-source chargeQgs8.5nC
Gate-drain chargeQgd20nC
Drain-source diode forward voltageVSDVGS=0V,ISD=12.0A1.4V
Continuous drain-source currentISD12.0A
Pulsed drain-source currentISM48.0A
Reverse recovery timetrrISD=12.0A dlSD/dt=100A/μs (note4)430ns
Reverse recovery chargeQrr5.0µC

2411121006_KIA-Semicon-Tech-KIA12N65H_C135551.pdf

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