Silicon Carbide MOSFET Model S1M040120H 1200V Designed for EV Battery Chargers and On Board Chargers

Key Attributes
Model Number: S1M040120H
Product Custom Attributes
Configuration:
-
Drain To Source Voltage:
1.2kV
Current - Continuous Drain(Id):
76A
RDS(on):
32mΩ@18V
Operating Temperature -:
-55℃~+175℃
Gate Threshold Voltage (Vgs(th)):
2.8V
Type:
N-Channel
Reverse Transfer Capacitance (Crss@Vds):
10pF
Pd - Power Dissipation:
357W
Output Capacitance(Coss):
127pF
Input Capacitance(Ciss):
2.159nF
Gate Charge(Qg):
76nC
Mfr. Part #:
S1M040120H
Package:
TO-247-4L
Product Description

Product Overview

The S1M040120H is a 1200V Silicon Carbide (SiC) Power MOSFET designed for high-speed switching applications. It offers very low switching losses, IGBT-compatible driving voltage, and fully controllable dv/dt, leading to reduced cooling efforts, improved efficiency, and increased power density. This MOSFET is ideal for on-board chargers, EV battery chargers, booster/DC-DC converters, and switch-mode power supplies.

Product Attributes

  • Brand: SiC (Sichain Semiconductor)
  • Origin: China (Ningbo)
  • Material: Silicon Carbide (SiC)
  • Compliance: Halogen-free, RoHS compliant, REACH compliant
  • Package Type: TO-247-4L

Technical Specifications

Model VDS (V) IDS (A) (TC=25C) RDS(ON) typ (m) (VGS=15V, ID=40A, TJ=25C) TJ,max (C) Package
S1M040120H 1200 76 40 175 TO247-4L
Symbol Parameter Value Unit Test Conditions Note
VDS,max Drain source voltage 1200 V VGS = 0V, ID = 100A
VGS,max Gate source voltage -8 / +22 V Absolute maximum values Note1
VGSop Gate source voltage -4 / +15 V Recommended operational values
ID Continuous drain current 76 A VGS = 15V, TC = 25C Fig.19
ID Continuous drain current 53 A VGS = 15V, TC = 100C
ID(pulse) Pulsed drain current 120 A Pulse width tP limited by Tj,max Fig.22
PD Power dissipation 357 W TC= 25C, TJ = 175C Fig.20
TJ, Tstg Operating Junction and storage temperature -55 to +175 C
TL Soldering temperature 260 C 1.6mm (0.063) from case for 10s
Rth(j-c) Thermal resistance from junction to case 0.42 C/W Fig.21
Rth(j-a) Thermal resistance from junction to ambient 33 C/W Not subject to production test. Parameter verified by design/characterization.
V(BR)DSS Drain-source breakdown voltage 1200 V VGS = 0V, ID = 100A
VGS(th) Gate threshold voltage 2.3 / 2.8 / 3.6 V VDS = VGS, ID = 10mA Fig.11
VGS(th) Gate threshold voltage 2.0 V VDS = VGS, ID = 10mA, TJ = 175C
IDSS Zero gate voltage drain current 1 A VDS = 1200V, VGS = 0V TJ = 25C
IDSS Zero gate voltage drain current 10 A VDS = 1200V, VGS = 0V TJ = 175C
IGSS Gate source leakage current 100 nA VGS = 15V, VDS = 0V
RDS(on) Current drain-source on-state resistance 40 / 50 m VGS = 15V, ID = 33.3A Fig.4, 5,6
RDS(on) Current drain-source on-state resistance 62 m VGS = 15V, ID = 33.3A, TJ = 175C
RDS(on) Current drain-source on-state resistance 32 / 40 m VGS = 18V, ID = 33.3A
RDS(on) Current drain-source on-state resistance 59 m VGS = 18V, ID = 33.3A, TJ = 175C
gfs Transconductance 17 S VDS = 20V, ID = 33.3A Fig.7
gfs Transconductance 16 S VDS = 20V, ID = 33.3A, TJ = 175C
Rg,int Internal gate resistance 0.9 VAC = 25mV, f = 1MHz
VSD Diode forward voltage 3.8 V VGS = -4V, ISD = 20A Fig.8,9, 10
VSD Diode forward voltage 3.4 V VGS = -4V, ISD = 20A, TJ = 175C
Ciss Input capacitance 2159 pF VDS = 1000V, VGS = 0V, TJ = 25C, VAC = 25mV, f = 100KHz Fig.17,18
Coss Output capacitance 127 pF VDS = 1000V, VGS = 0V, TJ = 25C, VAC = 25mV, f = 100KHz Fig.17,18
Crss Reverse capacitance 10 pF VDS = 1000V, VGS = 0V, TJ = 25C, VAC = 25mV, f = 100KHz Fig.17,18
Eoss Coss stored energy 79 J Fig.16
Qgs Gate source charge 16 nC VDS = 800V, VGS = -4/+15V, ID = 33.3A Fig.12
Qgd Gate drain charge 36 nC VDS = 800V, VGS = -4/+15V, ID = 33.3A Fig.12
Qg Gate charge 76 nC VDS = 800V, VGS = -4/+15V, ID = 33.3A Fig.12
Eon Turn on switching energy 259 J VDS = 800V, VGS = -4/+15V, ID = 33.3A, Rg = 2.5, L = 120uH Fig.26
Eoff Turn off switching energy 50 J VDS = 800V, VGS = -4/+15V, ID = 33.3A, Rg = 2.5, L = 120uH Fig.26
td(on) Turn on delay time 31 ns VDS = 800V, VGS = -4/+15V, ID = 33.3A, Rg = 2.5, L = 120uH Fig.27
tr Rise time 18 ns VDS = 800V, VGS = -4/+15V, ID = 33.3A, Rg = 2.5, L = 120uH Fig.27
td(off) Turn off delay time 32 ns VDS = 800V, VGS = -4/+15V, ID = 33.3A, Rg = 2.5, L = 120uH Fig.27
tf Fall time 9 ns VDS = 800V, VGS = -4/+15V, ID = 33.3A, Rg = 2.5, L = 120uH Fig.27
VSD Diode forward voltage 3.8 V VGS = -4V, ISD = 20A Fig.8,9, 10
VSD Diode forward voltage 3.4 V VGS = -4V, ISD = 20A, TJ = 175C
IS Continuous diode forward current 76 A VGS = -4V, Tc = 25C Note1
trr Reverse recovery time 56 nS VR = 800V, VGS = -4V, ID = 33.3A, di/dt = 2325A/S, TJ = 175C
Qrr Reverse recovery charge 660 nC VR = 800V, VGS = -4V, ID = 33.3A, di/dt = 2325A/S, TJ = 175C
Irrm Peak reverse recovery current 22 A VR = 800V, VGS = -4V, ID = 33.3A, di/dt = 2325A/S, TJ = 175C

2410121937_Sichainsemi-S1M040120H_C22363605.pdf

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