P channel MOSFET featuring low on resistance and fast switching FETek FKS3115 for power management

Key Attributes
Model Number: FKS3115
Product Custom Attributes
Drain To Source Voltage:
30V
Current - Continuous Drain(Id):
14A
RDS(on):
8.7mΩ@10V,12A
Operating Temperature -:
-55℃~+150℃
Gate Threshold Voltage (Vgs(th)):
1.2V
Reverse Transfer Capacitance (Crss@Vds):
421pF@15V
Number:
1 P-Channel
Input Capacitance(Ciss):
3.448nF@15V
Pd - Power Dissipation:
1.5W
Gate Charge(Qg):
30nC@4.5V
Mfr. Part #:
FKS3115
Package:
SOP-8
Product Description

Product Overview

The FKS3115 is a high cell density trenched P-channel MOSFET designed for fast switching applications. It offers excellent on-resistance (RDSON) and low gate charge, making it ideal for synchronous buck converter applications. This device meets RoHS and Green Product requirements and is 100% EAS guaranteed with full function reliability approval.

Product Attributes

  • Brand: FETek
  • Product Line: FKS3115
  • Type: P-Channel MOSFET
  • Certifications: RoHS, Green Product
  • Key Features: 100% EAS Guaranteed, Green Device Available, Super Low Gate Charge, Excellent CdV/dt effect decline, Advanced high cell density Trench technology

Technical Specifications

ParameterConditionsMin.Typ.Max.UnitNotes
VDSDrain-Source Voltage-30V
VGSGate-Source Voltage±20V
ID@TA=25Continuous Drain Current, VGS @ -10V-14A1
ID@TA=70Continuous Drain Current, VGS @ -10V-11A1
IDMPulsed Drain Current-56A2
EASSingle Pulse Avalanche Energy151mJ3
IASAvalanche Current-55A
PD@TA=25Total Power Dissipation1.5W4
TSTGStorage Temperature Range-55150
TJOperating Junction Temperature Range-55150
RJAThermal Resistance Junction-Ambient40/W1 (t≤10s)
RJAThermal Resistance Junction-Ambient75/W1
RJCThermal Resistance Junction-Case24/W1
BVDSSDrain-Source Breakdown Voltage-30VVGS=0V , ID=-250uA
ΔBVDSS/ΔTJBVDSS Temperature Coefficient-0.018V/Reference to 25 , ID=-1mA
RDS(ON)Static Drain-Source On-Resistance8.72, VGS=-10V , ID=-12A
RDS(ON)Static Drain-Source On-Resistance13.52, VGS=-4.5V , ID=-10A
VGS(th)Gate Threshold Voltage-1.2-2.5VVGS=VDS , ID =-250uA
ΔVGS(th)VGS(th) Temperature Coefficient5.04mV/
IDSSDrain-Source Leakage Current-1μAVDS=-24V , VGS=0V , TJ=25
IDSSDrain-Source Leakage Current-5μAVDS=-24V , VGS=0V , TJ=55
IGSSGate-Source Leakage Current±100nAVGS=±20V , VDS=0V
gfsForward Transconductance25SVDS=-5V , ID=-12A
QgTotal Gate Charge30nC(-4.5V) VDS=-15V , VGS=-4.5V , ID=-12A
QgsGate-Source Charge10nC
QgdGate-Drain Charge10.4nC
Td(on)Turn-On Delay Time9.4nsVDD=-15V , VGS=-10V , RG=3.3Ω, ID=-1A
TrRise Time10.2ns
Td(off)Turn-Off Delay Time117ns
TfFall Time24ns
CissInput Capacitance3448pFVDS=-15V , VGS=0V , f=1MHz
CossOutput Capacitance508pF
CrssReverse Transfer Capacitance421pF
ISContinuous Source Current-14A1,5, VG=VD=0V , Force Current
ISMPulsed Source Current-56A2,5
VSDDiode Forward Voltage-1.2V2, VGS=0V , IS=-1A , TJ=25
trrReverse Recovery Time19.4nSIF=-10A , dI/dt=100A/μs , TJ=25
QrrReverse Recovery Charge9.1nC

Notes:
1. The data tested by surface mounted on a 1 inch² FR-4 board with 2OZ copper.
2. The data tested by pulsed, pulse width ≤ 300μs, duty cycle ≤ 2%.
3. The EAS data shows Max. rating. The test condition is VDD=-25V, VGS=-10V, L=0.1mH, IAS=-55A.
4. The power dissipation is limited by 150 junction temperature.
5. The data is theoretically the same as ID and IDM, in real applications, should be limited by total power dissipation.


2410121538_FETek-FKS3115_C5361873.pdf

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