P channel MOSFET featuring low on resistance and fast switching FETek FKS3115 for power management
Product Overview
The FKS3115 is a high cell density trenched P-channel MOSFET designed for fast switching applications. It offers excellent on-resistance (RDSON) and low gate charge, making it ideal for synchronous buck converter applications. This device meets RoHS and Green Product requirements and is 100% EAS guaranteed with full function reliability approval.
Product Attributes
- Brand: FETek
- Product Line: FKS3115
- Type: P-Channel MOSFET
- Certifications: RoHS, Green Product
- Key Features: 100% EAS Guaranteed, Green Device Available, Super Low Gate Charge, Excellent CdV/dt effect decline, Advanced high cell density Trench technology
Technical Specifications
| Parameter | Conditions | Min. | Typ. | Max. | Unit | Notes |
| VDS | Drain-Source Voltage | -30 | V | |||
| VGS | Gate-Source Voltage | ±20 | V | |||
| ID@TA=25 | Continuous Drain Current, VGS @ -10V | -14 | A | 1 | ||
| ID@TA=70 | Continuous Drain Current, VGS @ -10V | -11 | A | 1 | ||
| IDM | Pulsed Drain Current | -56 | A | 2 | ||
| EAS | Single Pulse Avalanche Energy | 151 | mJ | 3 | ||
| IAS | Avalanche Current | -55 | A | |||
| PD@TA=25 | Total Power Dissipation | 1.5 | W | 4 | ||
| TSTG | Storage Temperature Range | -55 | 150 | |||
| TJ | Operating Junction Temperature Range | -55 | 150 | |||
| RJA | Thermal Resistance Junction-Ambient | 40 | /W | 1 (t≤10s) | ||
| RJA | Thermal Resistance Junction-Ambient | 75 | /W | 1 | ||
| RJC | Thermal Resistance Junction-Case | 24 | /W | 1 | ||
| BVDSS | Drain-Source Breakdown Voltage | -30 | V | VGS=0V , ID=-250uA | ||
| ΔBVDSS/ΔTJ | BVDSS Temperature Coefficient | -0.018 | V/ | Reference to 25 , ID=-1mA | ||
| RDS(ON) | Static Drain-Source On-Resistance | 8.7 | mΩ | 2, VGS=-10V , ID=-12A | ||
| RDS(ON) | Static Drain-Source On-Resistance | 13.5 | mΩ | 2, VGS=-4.5V , ID=-10A | ||
| VGS(th) | Gate Threshold Voltage | -1.2 | -2.5 | V | VGS=VDS , ID =-250uA | |
| ΔVGS(th) | VGS(th) Temperature Coefficient | 5.04 | mV/ | |||
| IDSS | Drain-Source Leakage Current | -1 | μA | VDS=-24V , VGS=0V , TJ=25 | ||
| IDSS | Drain-Source Leakage Current | -5 | μA | VDS=-24V , VGS=0V , TJ=55 | ||
| IGSS | Gate-Source Leakage Current | ±100 | nA | VGS=±20V , VDS=0V | ||
| gfs | Forward Transconductance | 25 | S | VDS=-5V , ID=-12A | ||
| Qg | Total Gate Charge | 30 | nC | (-4.5V) VDS=-15V , VGS=-4.5V , ID=-12A | ||
| Qgs | Gate-Source Charge | 10 | nC | |||
| Qgd | Gate-Drain Charge | 10.4 | nC | |||
| Td(on) | Turn-On Delay Time | 9.4 | ns | VDD=-15V , VGS=-10V , RG=3.3Ω, ID=-1A | ||
| Tr | Rise Time | 10.2 | ns | |||
| Td(off) | Turn-Off Delay Time | 117 | ns | |||
| Tf | Fall Time | 24 | ns | |||
| Ciss | Input Capacitance | 3448 | pF | VDS=-15V , VGS=0V , f=1MHz | ||
| Coss | Output Capacitance | 508 | pF | |||
| Crss | Reverse Transfer Capacitance | 421 | pF | |||
| IS | Continuous Source Current | -14 | A | 1,5, VG=VD=0V , Force Current | ||
| ISM | Pulsed Source Current | -56 | A | 2,5 | ||
| VSD | Diode Forward Voltage | -1.2 | V | 2, VGS=0V , IS=-1A , TJ=25 | ||
| trr | Reverse Recovery Time | 19.4 | nS | IF=-10A , dI/dt=100A/μs , TJ=25 | ||
| Qrr | Reverse Recovery Charge | 9.1 | nC |
Notes:
1. The data tested by surface mounted on a 1 inch² FR-4 board with 2OZ copper.
2. The data tested by pulsed, pulse width ≤ 300μs, duty cycle ≤ 2%.
3. The EAS data shows Max. rating. The test condition is VDD=-25V, VGS=-10V, L=0.1mH, IAS=-55A.
4. The power dissipation is limited by 150 junction temperature.
5. The data is theoretically the same as ID and IDM, in real applications, should be limited by total power dissipation.
2410121538_FETek-FKS3115_C5361873.pdf
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