Fast Switching Dual N Channel MOSFET HUASHUO HSW6800 Designed for Small Power Load Switch Applications

Key Attributes
Model Number: HSW6800
Product Custom Attributes
Drain To Source Voltage:
30V
Current - Continuous Drain(Id):
4A
Operating Temperature -:
-55℃~+150℃
RDS(on):
45mΩ@4.5V
Gate Threshold Voltage (Vgs(th)):
1.3V@250uA
Type:
N-Channel
Reverse Transfer Capacitance (Crss@Vds):
73pF@15V
Number:
2 N-Channel
Input Capacitance(Ciss):
880pF@15V
Pd - Power Dissipation:
1.4W
Gate Charge(Qg):
9.5nC@4.5V
Mfr. Part #:
HSW6800
Package:
SOT-23-6L
Product Description

Product Overview

The HSW6800 is a dual N-channel fast switching MOSFET featuring high cell density trench technology. It offers excellent RDS(ON) and efficiency, making it ideal for various small power switching and load switch applications. This product meets RoHS and Green Product requirements and is available as a green device. Key advantages include super low gate charge and excellent Cdv/dt effect decline.

Product Attributes

  • Brand: HS-Semi
  • Model: HSW6800
  • Technology: Trench MOSFET
  • Channel Type: Dual N-Channel
  • Switching Speed: Fast
  • Certifications: RoHS, Green Product
  • Package: SOT23-6L

Technical Specifications

Symbol Parameter Conditions Min. Typ. Max. Units
Absolute Maximum Ratings
VDS Drain-Source Voltage 30 V
VGS Gate-Source Voltage 12 V
ID@TA=25 Continuous Drain Current, VGS @ 4.5V1 4 A
ID@TA=70 Continuous Drain Current, VGS @ 4.5V1 3 A
IDM Pulsed Drain Current2 16 A
PD@TA=25 Total Power Dissipation3 1.4 W
TSTG Storage Temperature Range -55 150
TJ Operating Junction Temperature Range -55 150
Thermal Data
RJA Thermal Resistance Junction-ambient 90 /W
Electrical Characteristics (TJ=25 , unless otherwise noted)
BVDSS Drain-Source Breakdown Voltage VGS=0V , ID=250uA 30 V
BVDSS/TJ BVDSS Temperature Coefficient Reference to 25 , ID=1mA 0.029 V/
RDS(ON),max Static Drain-Source On-Resistance2 VGS=4.5V , ID=4A 32 45 m
VGS=2.5V , ID=3A 45 60 m
VGS(th) Gate Threshold Voltage VGS=VDS , ID =250uA 0.6 0.9 1.3 V
VGS(th)/TJ VGS(th) Temperature Coefficient -2.82 mV/
IDSS Drain-Source Leakage Current VDS=24V , VGS=0V , TJ=25 1 uA
VDS=24V , VGS=0V , TJ=55 5 uA
IGSS Gate-Source Leakage Current VGS=12V , VDS=0V 100 nA
gfs Forward Transconductance VDS=5V , ID=2A 5 S
Qg Total Gate Charge (4.5V) VDS=15V , VGS=4.5V , ID=4A 9.5 nC
Qgs Gate-Source Charge 1.6 nC
Qgd Gate-Drain Charge 3 nC
td(on) Turn-On Delay Time VDD=15V , VGS=4.5V , RG=3.3, ID=3A 3.2 ns
tr Rise Time 4.9 ns
td(off) Turn-Off Delay Time 22 ns
tf Fall Time 4 ns
Ciss Input Capacitance VDS=15V , VGS=0V , f=1MHz 880 pF
Coss Output Capacitance 99 pF
Cr Reverse Transfer Capacitance 73 pF
Diode Characteristics
IS Continuous Source Current1,4 VG=VD=0V , Force Current 4 A
ISM Pulsed Source Current2,4 16 A
VSD Diode Forward Voltage2 VGS=0V , IS=1A , TJ=25 1.2 V

Notes:
1 The data tested by surface mounted on a 1 inch2 FR-4 board with 2OZ copper.
2 The data tested by pulsed, pulse width 300s, duty cycle 2%.
3 The power dissipation is limited by 150 junction temperature.
4 The data is theoretically the same as ID and IDM, in real applications, should be limited by total power dissipation.


2410121653_HUASHUO-HSW6800_C2828481.pdf
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