P channel MOSFET FETek FKN0107 featuring low gate charge and improved Cdv dt effect for load switches
Product Overview
The FKN0107 is a high cell density trenched P-channel MOSFET designed for excellent RDSON and efficiency in small power switching and load switch applications. It meets RoHS and Green Product requirements with full function reliability approved. Key advantages include super low gate charge, excellent Cdv/dt effect decline, and advanced high cell density Trench technology.
Product Attributes
- Brand: FETek Technology Corp.
- Product Type: P-Ch 100V Fast Switching MOSFETs
- Certifications: RoHS, Green Product
Technical Specifications
| Symbol | Parameter | Conditions | Min. | Typ. | Max. | Unit |
| Electrical Characteristics | BVDSS | Drain-Source Breakdown Voltage, VGS=0V , ID=-250uA | -100 | V | ||
| RDS(ON) | Static Drain-Source On-Resistance, VGS=-10V , ID=-0.8A | 0.52 | 0.65 | Ω | ||
| VGS(th) | Gate Threshold Voltage, VGS=VDS , ID =-250uA | -1.0 | -1.5 | -2.5 | V | |
| IDSS | Drain-Source Leakage Current, VDS=-80V , VGS=0V , TJ=25 | 10 | uA | |||
| IGSS | Gate-Source Leakage Current, VGS=±20V , VDS=0V | ±100 | nA | |||
| Qg | Total Gate Charge (-4.5V), VDS=-15V , VGS=-4.5V , ID=-0.5A | 4.5 | nC | |||
| Ciss | Input Capacitance, VDS=-15V , VGS=0V , f=1MHz | 553 | pF | |||
| Absolute Maximum Ratings | ID | Continuous Drain Current, VGS @ -10V, TA=25 | -0.9 | A | ||
| IDM | Pulsed Drain Current | -1.8 | A | |||
| PD | Total Power Dissipation, TA=25 | 1 | W | |||
| Thermal Data | RJA | Thermal Resistance Junction-ambient | 125 | /W | ||
| RJC | Thermal Resistance Junction-Case | 80 | /W | |||
| TSTG | Storage Temperature Range | -55 | 150 | |||
| Diode Characteristics | IS | Continuous Source Current, VG=VD=0V | -0.9 | A | ||
| ISM | Pulsed Source Current | -1.8 | A | |||
| VSD | Diode Forward Voltage, VGS=0V , IS=-1A , TJ=25 | -1.2 | V |
2411220202_FETek-FKN0107_C2926959.pdf
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