Trench N Channel MOSFET HUASHUO HSP30N15A Featuring Low Gate Charge and Excellent RDS ON Performance
HSP30N15A N-Ch 150V Fast Switching MOSFETs
Product Overview
The HSP30N15A is a high-performance trench N-channel MOSFET designed for synchronous buck converter applications. It features extreme high cell density, offering excellent RDS(ON) and low gate charge. This MOSFET meets RoHS and Green Product requirements, is 100% EAS guaranteed, and has full function reliability approval. Key advantages include super low gate charge, excellent Cdv/dt effect decline, and advanced high cell density Trench technology, making it suitable for demanding power conversion scenarios.
Product Attributes
- Brand: HS-Semi
- Product Type: N-Channel MOSFET
- Technology: Trench
- Certifications: RoHS, Green Product
- Reliability: 100% EAS guaranteed, full function reliability approved
Technical Specifications
| Symbol | Parameter | Conditions | Min. | Typ. | Max. | Unit |
|---|---|---|---|---|---|---|
| Absolute Maximum Ratings | ||||||
| VDS | Drain-Source Voltage | 150 | V | |||
| VGS | Gate-Source Voltage | ±20 | V | |||
| ID@TC=25 | Continuous Drain Current, VGS @ 10V1 | 30 | A | |||
| ID@TC=100 | Continuous Drain Current, VGS @ 10V1 | 18 | A | |||
| ID@TA=25 | Continuous Drain Current, VGS @ 10V1 | 4.9 | A | |||
| ID@TA=70 | Continuous Drain Current, VGS @ 10V1 | 3.9 | A | |||
| IDM | Pulsed Drain Current2 | 60 | A | |||
| PD@TC=25 | Total Power Dissipation3 | 81 | W | |||
| TSTG | Storage Temperature Range | -55 | 150 | |||
| TJ | Operating Junction Temperature Range | -55 | 150 | |||
| Thermal Data | ||||||
| RJA | Thermal Resistance Junction-ambient | 60 | /W | |||
| RJC | Thermal Resistance Junction-Case1 | 1.2 | /W | |||
| Electrical Characteristics | ||||||
| BVDSS | Drain-Source Breakdown Voltage | VGS=0V , ID=250uA | 150 | V | ||
| RDS(ON) | Static Drain-Source On-Resistance2 | VGS=10V , ID=10A | 40 | 56 | m | |
| VGS(th) | Gate Threshold Voltage | VGS=VDS , ID =250uA | 2 | 2.9 | 4 | V |
| IDSS | Drain-Source Leakage Current | VDS=120V , VGS=0V , TJ=25 | 1 | uA | ||
| IDSS | Drain-Source Leakage Current | VDS=120V , VGS=0V , TJ=55 | 5 | uA | ||
| IGSS | Gate-Source Leakage Current | VGS=±20V , VDS=0V | ±100 | nA | ||
| gfs | Forward Transconductance | VDS=5V , ID=10A | 25 | S | ||
| Qg | Total Gate Charge | VDS=75V , VGS=10V , ID=10A | 23 | nC | ||
| Qgs | Gate-Source Charge | 5.8 | ||||
| Qgd | Gate-Drain Charge | 4.2 | ||||
| td(on) | Turn-On Delay Time | VDD=75V , VGS=10V , RG=3.3 , ID=10A | 16 | ns | ||
| tr | Rise Time | 18.6 | ||||
| td(off) | Turn-Off Delay Time | 28.5 | ||||
| tf | Fall Time | 6.5 | ||||
| Ciss | Input Capacitance | VDS=75V , VGS=0V , f=1MHz | 1190 | pF | ||
| Coss | Output Capacitance | 73 | ||||
| Crss | Reverse Transfer Capacitance | 4 | ||||
| Diode Characteristics (TJ=25 , unless otherwise noted) | ||||||
| VSD | Diode Forward Voltage2 | VGS=0V , IS=1A | 1.2 | V | ||
| trr | Reverse Recovery Time | IF=10A , dI/dt=100A/s , TJ=25 | 45 | nS | ||
| Qrr | Reverse Recovery Charge | 138 | nC | |||
Notes:
- 1 Data tested by surface mounted on a 1 inch2 FR-4 board with 2OZ copper.
- 2 Data tested by pulsed, pulse width ≤ 300µs, duty cycle ≤ 2%.
- 3 Power dissipation is limited by 150 junction temperature.
- 4 Data is theoretically the same as ID and IDM; in real applications, should be limited by total power dissipation.
2411121146_HUASHUO-HSP30N15A_C7543711.pdf
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