Low gate charge N Channel MOSFET HUASHUO HSBL020N08 with excellent RDS ON and switching performance
Product Overview
The HSBL020N08 is a high cell density SGT N-channel MOSFET designed for fast switching applications. It offers excellent RDS(ON) and gate charge, making it suitable for synchronous rectification. This product meets RoHS and Halogen-Free compliant requirements and is 100% EAS guaranteed with full function reliability approval. Key features include super low gate charge, excellent CdV/dt effect decline, and advanced high cell density Trench technology.
Product Attributes
- Brand: HS-Semi
- Product Type: N-Channel MOSFET
- Compliance: RoHS, Halogen-Free
- Reliability: 100% EAS Guaranteed, Full Function Reliability Approved
- Technology: Advanced high cell density Trench technology
- Device Type: Green Device Available
Technical Specifications
| Symbol | Parameter | Conditions | Min. | Typ. | Max. | Unit |
|---|---|---|---|---|---|---|
| Absolute Maximum Ratings | ||||||
| VDS | Drain-Source Voltage | 80 | V | |||
| VGS | Gate-Source Voltage | 20 | V | |||
| ID@TC=25 | Continuous Drain Current, VGS @ 10V1,6 | 240 | A | |||
| ID@TC=100 | Continuous Drain Current, VGS @ 10V1,6 | 100 | A | |||
| IDM | Pulsed Drain Current2 | 730 | A | |||
| EAS | Single Pulse Avalanche Energy3 | 2500 | mJ | |||
| PD@TC=25 | Total Power Dissipation4 | 225 | W | |||
| TSTG | Storage Temperature Range | -55 | 150 | |||
| TJ | Operating Junction Temperature Range | -55 | 150 | |||
| Thermal Data | ||||||
| RJA | Thermal Resistance Junction-Ambient1 | --- | 60 | /W | ||
| RJC | Thermal Resistance Junction-Case1 | --- | 0.54 | /W | ||
| Electrical Characteristics (TJ=25 , unless otherwise noted) | ||||||
| BVDSS | Drain-Source Breakdown Voltage | VGS=0V , ID=250uA | 80 | --- | --- | V |
| RDS(ON) | Static Drain-Source On-Resistance2 | VGS=10V , ID=50A | 1.4 | 2.0 | m | |
| VGS(th) | Gate Threshold Voltage | VGS=VDS , ID =250uA | 2 | 3 | 4 | V |
| IDSS | Drain-Source Leakage Current | VDS=80V , VGS=0V , TJ=25 | --- | 1 | uA | |
| VDS=80V , VGS=0V , TJ=125 | --- | 5 | uA | |||
| IGSS | Gate-Source Leakage Current | VGS=20V , VDS=0V | --- | 100 | nA | |
| Rg | Gate Resistance | VDS=0V , VGS=0V , f=1MHz | --- | 2 | ||
| Qg | Total Gate Charge (10V) | VDS=40V , VGS=10V , ID=50A | 204 | --- | nC | |
| Qgs | Gate-Source Charge | 54 | --- | |||
| Qgd | Gate-Drain Charge | 47 | --- | |||
| Td(on) | Turn-On Delay Time | VDD=40V , VGS=10V , RL=3, ID=20A | 39 | --- | ns | |
| Tr | Rise Time | 136 | --- | |||
| Td(off) | Turn-Off Delay Time | 121 | --- | |||
| Tf | Fall Time | 156 | --- | |||
| Ciss | Input Capacitance | VDS=45V , VGS=0V , f=1MHz | 13650 | --- | pF | |
| Coss | Output Capacitance | 20100 | --- | |||
| Crss | Reverse Transfer Capacitance | 580 | --- | |||
| Diode Characteristics | ||||||
| VSD | Diode Forward Voltage2 | VGS=0V , IS=50A , TJ=25 | 0.85 | 1.2 | V | |
| Trr | Body Diode Reverse Recovery Time | IF=30A, DI/dt=500A/us | 112 | --- | ns | |
| Qrr | Body Diode Reverse Recovery charge | IF=30A, DI/dt=500A/us | 313 | --- | nC | |
2410121434_HUASHUO-HSBL020N08_C2987723.pdf
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