High cell density trench N channel MOSFET HUASHUO HSBB3016 optimized for synchronous buck converter and RoHS compliance

Key Attributes
Model Number: HSBB3016
Product Custom Attributes
Drain To Source Voltage:
30V
Current - Continuous Drain(Id):
30A
Operating Temperature -:
-55℃~+150℃
RDS(on):
4.6mΩ@4.5V,15A
Gate Threshold Voltage (Vgs(th)):
1V
Reverse Transfer Capacitance (Crss@Vds):
115pF@15V
Number:
1 N-channel
Input Capacitance(Ciss):
2.875nF@15V
Pd - Power Dissipation:
43.4W
Gate Charge(Qg):
39.6nC@10V
Mfr. Part #:
HSBB3016
Package:
PRPAK3x3-8L
Product Description

Product Overview

The HSBB3016 is a high cell density trenched N-channel MOSFET designed for synchronous buck converter applications. It offers excellent RDS(ON) and low gate charge, meeting RoHS and Green Product requirements. This device is 100% EAS guaranteed with full function reliability approved. Key advantages include super low gate charge, excellent CdV/dt effect decline, and advanced high cell density trench technology.

Product Attributes

  • Brand: HS-Semi
  • Product Type: N-channel MOSFET
  • Technology: Advanced high cell density Trench technology
  • Certifications: RoHS, Green Product
  • Reliability: 100% EAS guaranteed, full function reliability approved

Technical Specifications

Symbol Parameter Conditions Min. Typ. Max. Unit
Absolute Maximum Ratings
VDS Drain-Source Voltage 30 V
VGS Gate-Source Voltage ±20 V
ID@TC=25 Continuous Drain Current, VGS @ 10V1 30 A
ID@TC=100 Continuous Drain Current, VGS @ 10V1 24 A
IDM Pulsed Drain Current2 120 A
EAS Single Pulse Avalanche Energy3 144.7 mJ
IAS Avalanche Current 53.8 A
PD@TC=25 Total Power Dissipation4 43.4 W
PD@TA=25 Total Power Dissipation4 1.67 W
TSTG Storage Temperature Range -55 150
TJ Operating Junction Temperature Range -55 150
Thermal Data
RJA Thermal Resistance Junction-Ambient1 75 /W
RJC Thermal Resistance Junction-Case1 2.88 /W
Electrical Characteristics (TJ=25 , unless otherwise noted)
BVDSS Drain-Source Breakdown Voltage VGS=0V , ID=250uA 30 V
RDS(ON) Static Drain-Source On-Resistance2 VGS=10V , ID=20A 3.4 4 m
RDS(ON) Static Drain-Source On-Resistance2 VGS=4.5V , ID=15A 4.6 6 m
VGS(th) Gate Threshold Voltage VGS=VDS , ID =250uA 1.0 1.7 2.5 V
IDSS Drain-Source Leakage Current VDS=24V , VGS=0V , TJ=25 1 uA
IDSS Drain-Source Leakage Current VDS=24V , VGS=0V , TJ=55 5 uA
IGSS Gate-Source Leakage Current VGS=±20V , VDS=0V ±100 nA
gfs Forward Transconductance VDS=5V , ID=20A 75 S
Qg Total Gate Charge (10V) VDS=15V , VGS=10V , ID=20A 39.6 nC
Qg Total Gate Charge (4.5V) 19 nC
Qgs Gate-Source Charge 6 nC
Qgd Gate-Drain Charge 10 nC
Td(on) Turn-On Delay Time VDD=15V , VGS=10V , RG=1.5 ID=20A 10 ns
Tr Rise Time 22 ns
Td(off) Turn-Off Delay Time 49 ns
Tf Fall Time 7.8 ns
Ciss Input Capacitance VDS=15V , VGS=0V , f=1MHz 2875 pF
Coss Output Capacitance 400 pF
Crss Reverse Transfer Capacitance 115 pF
Diode Characteristics
IS Continuous Source Current1,5 VG=VD=0V , Force Current 30 A
VSD Diode Forward Voltage2 VGS=0V , IS=1A , TJ=25 1 V
Ordering Information
Part Number Package code Packaging
HSBB3016 PRPAK3*3 3000/Tape&Reel

Notes:
1. The data tested by surface mounted on a 1 inch 2 FR-4 board with 2OZ copper.
2. The data tested by pulsed, pulse width ≤ 300us, duty cycle ≤ 2%.
3. The EAS data shows Max. rating. The test condition is VDD=25V, VGS=10V, L=0.1mH, IAS=53.8A.
4. The power dissipation is limited by 150 junction temperature.
5. The data is theoretically the same as ID and IDM, in real applications, should be limited by total power dissipation.


2410121655_HUASHUO-HSBB3016_C508822.pdf

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